Modu-Lab

Low Cost Tools for High Tech Learning

Device Characterization Module

The probe station allows finished devices to be tested for various electrical properties. Signals are generated and collected via a National Instruments LabView™ IO card in a standard PC. System executables written by students and instructors from around the world will be available for download on the internet.

Stainless Steel Table Top

Vacuum Chuck

110 or 220 VAC

10X and 30X Microscope

1 Year Warranty

LabView™ Data Acquisition

Low Cost of Ownership

Magnetic Base Probes

Full Range Instrumentation

PC & Monitor Included

Easily Upgraded with National Instruments Cards!

Modu-LabLow Cost Tools for High Tech Learning

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